RFID Test Methodology and Automatic Test Equipment

Speaker:	Mr. Yu LIU
		Deputy director and the program manager
		RFID Research Center

Title: 		"RFID Test Methodology and Automatic Test Equipment"

Date:		Monday, 30 July 2007

Time:		11:00am - 12 noon

Venue:		Room 3501 (via lift nos. 25/26), HKUST

Abstract:

RFID test works are a series of measurements and experiments under
standard input. ISO/IEC 18046 and 18047 have regulated the basic test
objects and roles of the conformance and performance test of RFID
devices. We designed a set of detailed methods to capture the physical
parameters and system status of RFID readers and tags, and summarized
them to RFID test methodology, which is including test principle, test
technique, test system and data process. Some special test equipments
were developed to automate the test process. Furthermore, the test
database is valuable for software developing and system integration by
its ample interfaces and configurations which can provide simulated data.


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Biography

Liu is a deputy director and the program manager of RFID Research
Center, CASIA. His research interests focus on the short-range wireless
communication technologies, especially on the test method of RFID
technology. Under the support by Chinese government, Liu and his RFID
center are going to establish a National RFID Test Center to promote the
development of RFID in China. Liu is one of the core members of Chinese
standard committee, and was the chief editor of (Chinese RFID Technology
and Policies White Paper). In last three years, Liu has applied for over
20 patents in RFID test methods and solutions.